4H 和 6H-SiC的介电常数.pdfVIP

Dielectric functions of bulk 4H and 6H SiC and spectroscopic ellipsometry studies of thin SiC films on Si Stefan Zollner, J. G. Chen, Erika Duda, T. Wetteroth, S. R. Wilson et al. Citation: J. Appl. Phys. 85, 8353 (1999); doi: 10.1063/1.370682 View online: /10.1063/1.370682 View Table of Contents: /resource/1/JAPIAU/v85/i12 Published by the American Institute of Physics. Related Articles Strain control of orbital polarization and correlated metal-insulator transition in La2CoMnO6 from first principles Appl. Phys. Lett. 99, 202110 (2011) The role of plasmons and interband transitions