原子力显微镜技术(德氏纳米科技大全).pdfVIP

Atomic Force Microscopy Studies of Metal Ion Sorption Viriya Vithayaveroj Sotira Yiacoumi Georgia Institute of Technology, Atlanta, Georgia, U.S.A. Costas Tsouris Oak Ridge National Laboratory, Oak Ridge, Tennessee, U.S.A. INTRODUCTION of metal ions on sorption and colloidal behavior. The AFM cantilever with an attached colloidal particle can be Sorption plays an important role both in natural waters regarded as a sensor in water/wastewater systems. and in water treatment processes, and is one of the techniques used to remove metal ions from aqueous solutions. However, the uptake of metal ions from ATOMIC FORCE MICROSCOPY aqueous solutions is limited by interactions between ions and surfaces in contact with the solution. Moreover, the Atomic force microscopy was developed from scanning fate and transport of metal ions are controlled by their tunneling microscopy by Binnig et al.[13] in 1986. In reactions with surfaces at the solid–liquid interface. For addition to rendering images of surfaces with nanoscale example, inorganic colloids such as clays, metal oxides, resolution, AFM has been used extensively in direct and carbonates have been reported as effective sorbents of measurements of interaction forces between approaching metal ions through ion exchange and surface complexa- similar surfaces and dissimilar surfaces such as particle– tion reactions.[1–4] It has also been noted that surface particle,[14–27] particle–plate,[19,25,28] and particle–bub- properties of sorbents, such as surface charge and ble[29–37] surfaces