《Improving ESD robustness of stacked diodes with embedded SCR for RF applicatuins in 65nm CMOS》.pptxVIP

Improving ESD Robustness of Stacked Diodes with Embedded SCR for RF Applications in 65-nm CMOS Chun-Yu Lin, Mei-Lian Fan, Ming-Dou Ker, Li-Wei Chu, Jen-Chou Tseng, and Ming-Hsiang Song IEEE International Reliability Physics Symposium, 可靠性物理国际研讨会 2014 ;Structure;Abstract;Introduction;Introduction;Introduction;ISTACKED DIODES WITH EMBEDDED SCR;Experimental Results;Experimental Results;Experimental Results;Conclutions;Acknowledgments;评价;Thanks