CoCu多层纳米线阵列的磁性能研究.pdf

Co/Cu 多层纳米线阵列的磁性能研究 姚素薇，宋振兴，王宏智，张卫国 (天津大学化工学院应用化学系杉山表面研究室，天津300072，中国) 摘 要：采用双槽法在阳极氧化铝膜（AAO ）的纳米孔中直流电沉积Co/Cu多层纳米线，调制波长分别控制为 50nm和200nm ，直径80nm。利用SEM和TEM测试多层线的结构与形貌，由VSM研究多层线的磁性能。测试结 果表明，Co/Cu 多层纳米线具有磁各向异性，当磁场与纳米线平行时，调制波长为50nm多层线的矫顽力为 1100Oe；磁场垂直于纳米线时，矫顽力为430Oe 。而调制波长为200nm多层线的矫顽力分别是360Oe和100Oe。 巨磁电阻效应（GMR ）测试结果表明，调制波长为50nm多层纳米线的磁电阻值高达75 ％，而调制波长为200nm 多层线基本上不产生GMR效应，这说明调制波长为200nm的多层线中Co的子层的厚度已达到或超过了Co的自 旋扩散长度(SDL)。 关键词：Co/Cu ；多层纳米线；GMR Fabrication and Magnetic Properties of Co/Cu Multilayer Nanowire Arrays 1 YAO Su-wei ，SONG Zhen-xing，WANG Hong-zhi ，ZHANG Wei-guo (SUGIYAMA Laboratory of Surface Technology, School of Chemical Engineering and Technology, Tianjin University, Tianjin 300072, China) Abstract: Co/Cu multilayer nanowire arrays with the bilayer thicknesses of 50nm and 200nm had been successfully prepared by dual-bath technique using direct current (DC) electrodeposition technology. Co and Cu were deposited into the an odic aluminum oxide (AAO) template. Transmission electron microscope (TEM) a nd scanning electron microscope (SEM) results show that the nanowires are regu larly spaced and uniform in shape with lengths of about 20μm and diameters of 80nm, and the bilayer thickness of the two samples are 50nm and 200nm respe ctively. The nanowire arrays have apparent magnetic anisotropy: for the sample o f bilayer thickness of 50nm, the magnetic coercivity of parallel to the nanowire arrays is 1100Oe and that of perpendicular to the nanowire arrays is 430Oe; for the sample of bilayer thickness of 200nm, the magnetic coercivity of parallel to the nanowire arrays is 360Oe and that of perpendicular to the nanowire ar