Electronics for the LHCb Outer Tracking Detector.ppt

Electronics for the LHCb Outer Tracking Detector Dirk Wiedner Physics Institute University of Heidelberg Germany LHCb Outer Tracker Electronics Placement Electronics Scheme Electronic Components in FE-Box HV-Boards Casting embedding Technology Production Testing ASD Board ASDBLR Testing OTIS TDC OTIS Wafer Test 47 wafers received 11/05 A wafer includes: 78 processed OTIS 1.2 78 processed OTIS 1.3 Test Procedure Power consumtion ok? (I300 mA @ 2.5V) Slow control test: Check position ID and registers FPGA test: Chip alive? Header ok? All channels alive? Measurement of Differential No Linearity for ch. 0,15,16,31 DNL 2.0 bins* for OTIS 1.2 *) 1 bin = 0.39 ns DNL 1.9 bins* for OTIS 1.3 L0 buffer overflow recognized? DACs functional Wafer Test on FPGA 4 000 000 data sets per chip (7332 chips) 1 MHz data rate (288 MBit/s) Data analysis on FPGA Histograms on FPGA internal memory Drift time Event counter Channel map Wafer Test Results Overall yield: OTIS 1.2: 88.65% →3250 functional OTIS 1.3: 91.53% →3284 functional ~2000 chips needed Chips are inked and sawed OTIS Board GOL-Auxiliary Board GOL 1.0 serializer for 128 straw channels QPLL 3 clock filter TFC signal distribution I2C signal distribution LV-power regulators GOL-AUX challenges Oscillating regulators: extra 100 μF at in and outputs Bad clock from outside: Radiation hard clock filter with 45 ps jitter pk-pk Rad hard differential signal distribution: Resistor network for current division GOL-Aux Testing checks: LV ripple (40 mV) Fast and slow control distribution TDC data after optical transmission Eye pattern (optical) Front End Tester Optical Link O-RxCard 12 way optical receiver commercial deserializers high density connector to TELL1 19.2 GBit/s O-RxCard O-RxCard now LHCb wide used Final production carried out by Tsinghua University All boards produced Testing ongoing O-RxCard BERT Bit error rate tested vs. optical attenuation 6 dB extra attenuation Ok 10 errors in 1012 Bit at 9 dB attenuation in