Semiconductor Laser Multi-Spectral Sensing and Imaging 英文参考文献.docVIP

Sensors 2010, 10, 544-583; doi:10.3390/s100100544 OPEN ACCESS sensors ISSN 1424-8220 /journal/sensors Article Semiconductor Laser Multi-Spectral Sensing and Imaging Han Q. Le 1,* and Yang Wang 1,2 1 Photonic Device and System Lab, Department of Electrical and Computer Engineering, D2-N318, University of Houston, 4800 Calhoun, Houston, TX 77204-4005, USA 2 Labsphere, Inc. 231 Shaker Street, North Sutton, NH 03260, USA; E-Mail: ywang@ * Author to whom correspondence should be addressed; E-Mail: hqle@; Tel.: +1-713-743-4465; Fax: +1-713-743-4444. Received: 23 November 2009; in revised form: 14 December 2009 / Accepted: 5 January 2010 / Published: 13 January 2010 Abstract: Multi-spectral laser imaging is a technique that can offer a combination of the laser capability of accurate spectral sensing with the desirable features of passive multispectral imaging. The technique can be used for detection, discrimination, and identification of objects by their spectral signature. This article describes and reviews the development and evaluation of semiconductor multi-spectral laser imaging systems. Although the method is certainly not specific to any laser technology, the use of semiconductor lasers is significant with respect to practicality and affordability. More relevantly, semiconductor lasers have their own characteristics; they offer excellent wavelength diversity but usually with modest power. Thus, system design and engineering issues are analyzed for approaches and trade-offs that can make the best use of semiconductor laser capabilities in multispectral imaging. A few systems were developed and the technique was tested and evaluated on a variety of natural and man-made objects. It was shown capable of high spectral resolution imaging which, unlike non-imaging point sensing, allows detecting and discriminating objects of interest