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- 2017-09-02 发布于天津
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矽锗奈米线与矽锗异质介面结构奈米线电子显微镜分析 - 国家奈米元件
NANO COMMUNICATION 21 No. 2
29
Electron Microscopy Analysis of SiGe Alloy
Nanowires and SiGe/Si Axial Heterojunction
Nanowire Structures
Abstract
Silicon (Si) and germanium (Ge) nanowires are potential candidates for future
applications in semiconductor device. SiGe alloy nanowires also exhibit excellent
transport properties for thermoelectric applications. In order to realize these applications,
controlling the morphology, growth direction, number density, and interior composition
distribution are very important. In this study, we grow Si nanowires, SiGe alloy nanowires,
and SiGe/Si heterojunction nanowires via the vapor-liquid-solid mechanism (VLS) in
a chemical vapor deposition (CVD) reactor. The morphology, Si/Ge composition ratio,
and the epitaxial relations of the nanowires with the substrates are discussed based on
the experimental results from scanning electron microscopy (SEM) and high-resolution
transmission electron microscopy (HRTEM).
30
Keywords
Silicon Germanium Nanowire Growth Vapor-liquid-solid
Mechanism Electron Microscopy Heterojunction Structure
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