a unified approach for predicting long- and short-term capability indices with dependence on manufacturing target bias一个统一的方法来预测长期和短期能力指数依赖制造业目标偏见.pdfVIP

Hindawi Publishing Corporation International Journal of Quality, Statistics, and Reliability Volume 2008, Article ID 594753, 10 pages doi:10.1155/2008/594753 Research Article A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias Nikhil T. Satyala and R. J. Pieper Department of Electrical Engineering, The University of Texas at Tyler, Tyler, TX 75799, USA Correspondence should be addressed to R. J. Pieper, rpieper@ Received 15 April 2008; Revised 25 September 2008; Accepted 14 December 2008 Recommended by Satish Bukkapatnam It is shown that the exact solution for the capability index (CPI) for Gaussian-distributed process with target bias can be expressed in terms of an unbiased CPI and a normalized target bias. The principal advantage of this specific formulation is that it facilitates evaluation of the degradation of the capability of the process due to bias between process mean and the process target. It is shown how this formalism, initially developed for the short-term process, is readily extended to long-term process for which the distribution is Gaussian. Readily isolated in the latter case are the two long-term CPI degrading effects, namely, process instability and target bias. Sufficient conditions to guarantee that long-term processes are distributed as Gaussian are discussed. Within the context of these assumed conditions, a new paradigm for a long-term locator “k” is proposed. For a three sigma process the results indicate that the exact CPI model is a less pessimistic predictor than both of the industry CPI models tested. Copyright © 2008 N. T. Satyala and R. J. Pieper. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use,