a rigorous temperature-dependent stochastic modelling and testing for mems-based inertial sensor errors严格的与温度有关的随机建模和测试mems-based惯性传感器错误.pdfVIP

Sensors 2009, 9, 8473-8489; doi:10.3390/s9 1108473 OPEN ACCESS sensors ISSN 1424-8220 /journal/sensors Article A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors Mohammed El-Diasty* and Spiros Pagiatakis Department of Earth and Space Science and Engineering, York University, Toronto, ON M3J 1P3, Canada; E-Mail: spiros@yorku.ca * Author to whom correspondence should be addressed; E-Mail: eldiasty@yorku.ca; Tel: +1-416-736-2100 ext.33136; Fax: +1-416-736-5817. Received: 6 August 2009; in revised form: 12 September 2009 / Accepted: 12 October 2009 / Published: 2 7 October 2009 Abstract: In this paper, we examine the effect of changing the temperature points on MEMS-based inertial sensor random error. We collect static data under different temperature points using a MEMS-based inertial sensor mounted inside a thermal chamber. Rigorous stochastic models, namely Autoregressive-based Gauss-Markov (AR-based GM) models are developed to describe the random error behaviour. The proposed AR-based GM model is initially applied to short stationary inertial data to develop the stochastic model parameters (correlation times). It is shown that the stochastic model parameters of a MEMS-based inertial unit, namely the ADIS16364, are temperature dependent. In addition, field kinematic test data collected at about 17 °C are used to test the performance of the