a review of domain modelling and domain imaging techniques in ferroelectric crystals回顾域建模和域成像技术在铁电晶体.pdfVIP

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a review of domain modelling and domain imaging techniques in ferroelectric crystals回顾域建模和域成像技术在铁电晶体.pdf

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a review of domain modelling and domain imaging techniques in ferroelectric crystals回顾域建模和域成像技术在铁电晶体

Materials 2011, 4, 417-447; doi:10.3390/ma4020417 OPEN ACCESS materials ISSN 1996-1944 /journal/materials Review A Review of Domain Modelling and Domain Imaging Techniques in Ferroelectric Crystals Prashant R. Potnis, Nien-Ti Tsou and John E. Huber * Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, UK; E-Mails: Prashant.Potnis@eng.ox.ac.uk (P.R.P.); Nien-ti.Tsou@eng.ox.ac.uk (N.T.T.) * Author to whom correspondence should be addressed; E-Mail: John.Huber@eng.ox.ac.uk; Tel.: +44-1865-2-83478; Fax: +44-1865-2-73010. Received: 11 January 2011 / Accepted: 14 February 2011 / Published: 16 February 2011 Abstract: The present paper reviews models of domain structure in ferroelectric crystals, thin films and bulk materials. Common crystal structures in ferroelectric materials are described and the theory of compatible domain patterns is introduced. Applications to multi-rank laminates are presented. Alternative models employing phase-field and related techniques are reviewed. The paper then presents methods of observing ferroelectric domain structure, including optical, polarized light, scanning electron microscopy, X-ray and neutron diffraction, atomic force microscopy and piezo-force microscopy. Use of more than one technique for unambiguous identification of the domain structure is also described. Keywords: single crystals ferroelectrics; microstructure; characterization techniques 1. Introduction After the discovery of diele