Y电容引起的手机充电器漏电研究余彬.pdfVIP

网络出版时间：2017-09-28 06:07:20 网络出版地址：/kcms/detail/12.1420.TM0607.002.html DOI： 中图分类号：TM 133 文献标志码：A Y 电容引起的手机充电器漏电研究 余 彬，王 莉，阮立刚 （南京航空航天大学江苏省新能源发电与电能变换重点实验室，南京 210000 ） 摘要： 手机充电器的安全问题受到越来越多的关注，Y 电容是引起手机充电器漏电的一个原因。 基于目前市场上应用最为广泛的一款5V/2A 手机充电器，研究了Y 电容引起的手机充电器漏电问题， 论述了市电电源结构、USB 电缆线结构以及手机充电器结构，详细分析了Y 电容正常和Y 电容短路击 穿两种情况下的漏电回路、等效电路图以及漏电回路中关键元件的电压、电流波形，总结了漏电流与Y 电容的关系曲线，得到了Y 电容短路击穿以及Y 电容容值过大是造成人被电击的一个原因，最后通过 仿真和实验，验证了理论分析的正确性。 关键词：手机充电器；漏电；电击；Y 电容 Research on Leakage of Mobile Phone Charger Caused by Y Capacitor YU Bin, WANG Li, RUAN Ligang （Jiangsu Key Laboratory of New Energy Generation and Power Conversion, Nanjing University of Aeronautics and Astronautics, Nanjing 210000, China ） Abstract: More and more attention has been paid to the security of the mobile phone charger,and the Y capacitor is one of the reasons for the leakage of the charger. In this paper, the problem of the leakage of the mobile phone charger caused by Y capacitor is studied based on the 5V / 2A mobile phone charger which is the most widely used. The power structure, the USB cable structure and the mobile phone charger structure are discusses. By analyzing the waveforms of the voltage and the current of the key components in the leakage circuit where the Y capacitor is normal and the Y capacitor is short-circuit breakdown and the relation curves between the leakage current and the Y capacitance, it is concluded that the short-circuit breakdown of the Y capacitor and the excessive Y capacitance value is one of the causes of the e