基于MARCH算法的内存异常检测研究 MARCHTB及MARCHY算法分析毕业论文.doc

本科毕业论文 (毕业设计) 题 目：基于MARCH内存MARCH-TB及MARCH-Y算法分析 姓 名： 学 院：软件学院 系：软件工程 专 业：软件工程 年 级： 学 号： 指导教师（校内）： 职称： 年 月 摘 要BIST Abstract In todays industry, due to production of technology and improve of product design, and other reasons, the manufacturing cost of transistor continues down, but the basic cost of the test of transistor remains unchanged. Thus the test’s cost is rapidly catching up with the manufacturing cost, and will exceed its manufacturing costs. The reason is very simple, because of the high price of advanced test equipment makes the cost high. Therefore, the test methods and test algorithm has become the top priority of improving. This article start from can be tested on system-on-chip design theory, from the design to test the built-in self-testing methods in the study of memory testing methods to find a useful argument. Then, memory and storage unit of the fault type, thinking their characteristics and then compare the more commonly used method, detailed analysis of the characteristics of MARCH algorithm, to explore the MARCH algorithm improvements. In the article, in the second half to scholars and researchers in MARCH to study and improve the algorithm as the goal, the design of a MARCH algorithm-based detection system memory and system of priorities and carried out a detailed analysis of difficult. In this paper, including the fault of memory and memory test model algorithm analysis and design of the main Windows and DOS version of memory test system, a breakdown of its detailed design and operational effectiveness, and analyse the difficulties in achieving, to resolve. Keywords: MARCH Algorithm ，Memory， Memory Anomaly Detection ，BIST 目 录 摘要 II 引 言 1 第一章 存储器测试的发展 2 1.1存储器测试发展动态 2 1.2 BIST的测试方法 4 第二章 存储器的故障模型 8 2.1 存储器故障分类 8 2.2存储单元的简化功能故障 9 2.3存储器故障诊断算法分析 9 2.3.1 Checkerboard算法（棋盘法） 10 2.3.2 Gallop算法（奔跳法） 10 2.3.3 MARCH算法（进行法） 11 2.3.4基于棋盘算法的改进 11 第三章MARCH算法详细叙述 15 3.1 ATS和改进的ATS算法(MATS) 15 3.1.1 MATS算法 15 3.1.2