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航天继电器贮存加速试验及寿命预测方法的分析-analysis of storage acceleration test and life prediction method of aerospace relay.docx

航天继电器贮存加速试验及寿命预测方法的分析-analysis of storage acceleration test and life prediction method of aerospace relay.docx

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航天继电器贮存加速试验及寿命预测方法的分析-analysis of storage acceleration test and life prediction method of aerospace relay

AbstractAerospace Relay is widely used in weapons systems. The weapon has a long-term storage, but for single use. Therefore, prodicting relay storage life correctly has important theoretical significance and practical value for normal use of the military equipment. Currently, the storage acceleration test failure data are often difficult to obtain, conventional methods can not used to evaluate the shelf life. To solve this problem, based on the relay storage failure mechanism analysis, this paper study the aerospace relay accelerated test methods and storage life prediction methods.Currently, measured parameters are often selected from the general parameters, and not necessarily sensitive of accelerated stress. In this paper, the main aerospace relay storage failure mechanisms are analyzed. From contact corrosion film and stress relaxation mechanism, relay failures parameters are determined. Using ion diffusion theory, contact resistance storage degradation model is established. The reaction of force and the pick-up time is determined by experimental and simulation method, and pick-up time storage degradation model is established. These provide theoretical basis for the test plan and the storage life predicton.Aerospace Relay’s storage accelerated test plan, including the test’s type, the type and level of accelerated stress, the number of samples, the monitored parameters and the test conditions, is designed. Storage performance degradation data is got through storage acceleration test. The parameters selection is verified to be correct through trend analysis and correlation analysis.Storage Aerospace relay performance degradation is slow, and analyzing the degradation process can reveal the storage degradation. In this paper, storage life prediction method based on degraded data is studied. We use wavelet theory and time series stationary test method to pretreat the test data. The degradation fitting model is established. Each relay’s pseudo life is extrapolated.

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