SRAM型FPGA测试技术研究与测试平台开发-测试计量技术及仪器专业论文.docxVIP

摘 摘 要 Abstract Abstract 万方数据 万方数据 - - PAGE IV - 万方数据 摘 要 FPGA 作为现场集成技术的目标载体，已经被广泛应用。随着深亚微米超大规模 集成电路的发展，FPGA 的规模也在迅猛发展，其测试难度越来越大，测试费用在芯 片制造成本中占的比例也越来越大。对 FPGA 的测试进行广泛而又深入的研究有着重 要意义。 本文深入研究了 SRAM 型 FPGA 的内部构造，针对 FPGA 的测试提出了新的观 点和测试方法。采用改进型“阵列流水线法”，即并行测试法测试可编程输入输出资 源(IOB)，从而可以诊断多对 IOB 资源故障；采用基于数据选择器的阵列捆绑法测试 可编程逻辑资源(CLB)，提高了故障定位的精度和测试效率。 设计实现了 FPGA 的测试平台，该平台由 USB2.0 通信模块、测试控制器模块、 被测对象和测试软件平台组成的，通过该平台可完成对 FPGA 芯片动态配置、对 FPGA 施加测试向量并采集测试响应，通过分析测试响应以完成 FPGA 的测试。该平台采用 USB2.0 通信接口有效提高了 FPGA 测试效率，具有自动化和智能化特点，为 FPGA 测试理论的研究提供了良好的实践验证环境。 利用该测试平台对 FPGA 芯片进行了测试验证和故障诊断，测试结果表明本文提 出的 FPGA 测试方法可有效完成故障诊断，提高了故障定位的精度和测试效率。并通 过分析测试结果对测试理论有了更深入的认识。 关键词：FPGA 测试；编程配置；故障模型；测试平台；USB2.0 - I - Abstract As the targeting vector of field integration technology, FPGA has been used widely. With the development of deep sub-micron VLSI, the scale of FPGA is also developing rapidly, the difficulty for FPGA testing is increasing, The proportion of test cost in the chip manufacturing cost is also increasing. It has important sgnificance to do extensive and in-depth study for FPGA testing. The paper researched the internal structure of SRAM-Based FPGAs, put forward new ideas and test methods for FPGA testing. The paper adopted Improved Array Assembly Line Method, which is Parallel Test Method to test programmable Input and Output Block (IOB), so as to Diagnosis multiple-pairs IOB resource faults; and adopted Array-Bundled Method Base On Data Selector to test Configurable Logic Blocks (CLB), improved the accuracy of fault location and the testing efficiency. The paper designed and realized the FPGA test platform, which is composed by USB2.0 communication module, the test controller module, the measured object and test software platform. We can implement the dynamic configuration for FPGA chips、impose test vector and collect test response by the platform, and finish the test for FPGA through analyzing test response. The platform improved the test efficiency effectively by adopting USB2.0 communication in