基于等效移位寄存器的针对扫描链攻击的安全扫描设计-集成电路工程专业论文.docxVIP

AB ABSTRACT 万方数据 万方数据 万方数据 万方数据 ABSTRACT With the rapid progress of VLSI technology, increasing complexity in VLSI designs has raised concerns on testability of digital circuits, and scan chains are widely used for improving the testability of sequential circuits. However, the use of scan chains also makes internal registers easily accessible from primary inputs and outputs, thus allowing attackers to extract secret information inside a chip. To solve the security problems of a scan chain, a design called shift-register equivalent(SR-equivalent) is proposed where its functionality is equivalent to the usual shift register. The design has high security, but malfunctions might be introduced by long wires which is indispensable to a scan chain with many registers. In order to solve this problem, the combination of SR-equivalents has been analyzed and the result that the new circuit is also an SR-equivalent is found out. By partitioning a long scan circuit into several parts and then introducing short SR-equivalent circuits or extended shift-register equivalent circuits for those parts, long wires can be avoided and the risk of malfunction can be lowered. The new circuits also have good controllability and observability. The security of the proposed design with length k has been checked and the cardinality is the largest as 3(22k-1), (2k)2 and 4k222k corresponding to I2SR, LF2SR(LFSR) and I2LF2SR(I2LFSR) when the two parts are of equal length under two partitions. Further, the conditions of multiple partitions have been discussed. The cardinality of new circuit made by SR-equivalent circuits grows as the number of partition grows, especially when the total length is 100, the design reaches a max cardinality of 1044, 1031 and 1061 under 33 partitions. As for the design using SR-quasi-equivalent and GF2SR, when total length is 15, the design reaches a minimum cardinality of 1015 and 1022 respectively while the design using SR-equivalent is 109. Lastly, the area overhead