基于服装制造装备的低压电器智能测试系统-服装设计与工程专业论文.docxVIP

  • 3
  • 0
  • 约7.18万字
  • 约 94页
  • 2019-02-20 发布于上海
  • 举报

基于服装制造装备的低压电器智能测试系统-服装设计与工程专业论文.docx

I I 基于服装制造装备的低压电器智能测试系统 摘 要 本论文以服装制造装备为研究背景,研究目前低压电器性能对服装制造装备的稳 定运行起到的重大作用,从而引入集分布式控制技术、测试技术、智能技术为一体的 低压电器智能测试系统,改进现有手工经验测试方法,以适应日益增长服装加工生产 线自动化改造的市场需求,且拓展了服装加工行业研究深度及应用。本论文的主要工 作及创新点如下: (1)本论文根据低压断路器的过载延时校验理论,及对脱扣器上双金属片受热机 理的研究,建立双金属片受力及变形轨迹的动力学模型,从而实现双金属片多自由度 实时动态测试调整。 (2)本论文设计基于光、机、电一体化的新型激光扫描定位模块,实现对双金属 片上的螺钉螺母高精度、高效率的实时跟踪,是本论文的创新之处。 (3)本论文设计小型分布式控制系统结构,分为可编程逻辑控制器 PLC 过程控 制站、操作管理站及通讯系统。PLC 过程控制站,负责对设备提供测控电流及相关控 制程序,实现上电自检模块、激光定位、螺钉螺母调整模块等复杂工艺;操作管理站, 采用高级组态软件 WINCC 和通用接口 OPC 技术,实现对工况的检测、控制及数据 管理;通过 PROFIBUS 现场总线技术,建立高效的通讯网络。 本测试系统已进入生产阶段,运行稳定、良好。与原手工测试模式相比,生产每 台断路器的时间减少 30%以上。目前,生产出的低压断路器在服装制造装备中有着良好 的市场前景。 关键词:服装制造装备,低压电器,智能测试系统,PLC,WINCC I II INTELLIGENT TEST SYSTEM OF LOW-VOLTAGE APPARATUS IN GARMENT MACHINERY EQUITMENTS ABSTRACT Taking garments machinery industry as research background, this paper introduces an intelligent test system of low-voltage apparatus, integrated by testing, intelligence, and network technology. The paper firstly analyzed the over-load test theory and the heated mechanism of bi-metal strip in trip unit, and then it built a dynamic model of bi-metal strip, thereby providing the foundation to realize the real-time adjusting of the bi-metal strip. Secondly, the paper developed the test system as a distributed control system (DCS), consisting of two Master Stations, one Operation and Management Station and Communication System. The Master Station which took Simens S7-200 PLC as the main controller was set to control the equipments by control program coding by Ladder Diagram. The combination of the adjustment unit and localization unit solved the problem of the real-time adjusting of bi-metal strip in trip mechanism. The Operation and Management Station which was configured by WINCC realized the scene operation mode monitor and the production data management. The Profibus Technology was used in the Communication System. At last, the paper simulated the testing. The testing time of one breaker could be reduced by 30%, and the result was s

您可能关注的文档

文档评论(0)

1亿VIP精品文档

相关文档