基于近红外和中红外光谱技术的小麦粉品质检测及掺杂鉴别-食品科学.PDF

128 2014, Vol.35, No.12 食品科学 ※分析检测 基于近红外和中红外光谱技术的小麦粉 品质检测及掺杂鉴别方法 徐一茹，刘翠玲*，孙晓荣，吴胜男，董秀丽 （北京工商大学计算机与信息工程学院，北京 100048 ） 摘  要：针对国家标准法检测小麦粉品质的传统方法存在一定缺陷，提出基于近红外光谱和中红外光谱技术快速检 测面粉的方法，并基于偏最小二乘法建立了矫正模型，对小麦粉的灰分、水分、面筋品质指标进行了分析。对于小 麦粉的掺杂鉴别问题，基于标准法测光谱距离建立了聚类分析模型，结果表明，可实现对小麦面粉品质的快速检测 及掺杂鉴别。 关键词：小麦粉；近红外光谱；中红外光谱；偏最小二乘法；聚类分析 Determination of Wheat Flour Adulteration Based on Near- and Mid-Infrared Spectroscopy * XU Yi-ru, LIU Cui-ling , SUN Xiao-rong, WU Sheng-nan, DONG Xiu-li (School of Computer Science and Information Engineering, Beijing Technology and Business University, Beijing 100048, China) Abstract: A rapid method for the identification of wheat flour adulteration using near- and mid-infrared (NIR-MIR) spectroscopy was proposed to overcome the shortcomings of the conventional method described in the Chinese national standard. A calibration model was established using partial least squares regression analysis, and chemical analysis of wheat flour was performed for ash, moisture and gluten. Moreover, a clustering analysis model was developed based on the spectral distances measured by the standardized method to identify wheat flour adulteration. Our experimental results confirm that this NIR-MIR spectroscopic method permits the rapid identification of wheat flour adulteration. Key words: wheat flour; near-infrared spectroscopy; mid-infrared spectroscopy; partial least squares; cluster analysis 中图分类号：TS207.3 文献标志码：A 文章编号：1002-6630 （2014 ）12-0128-05 doi:10.7506/spkx1002-6630-201412025 伴随我国人民的生活水平不断提高，生活质量由温 粉中的水分含量[2] ：此方法是基于样本中的水分受热以 饱型向营养型、精细型、科学型转化的趋势日益明显。 后，产生的蒸汽压高于在电热干燥箱中的空气分压，从 面粉是日常主食中的重要一员；广大消费者和食品加工