防止8051瞬间掉电之外部保护应用线路设计-新茂国际科技股份有限.PDFVIP

新茂國際科技股份有限公司 8051 Series MCU Application Note SyncMOS Technologies Inc. Ext-Brown-out Protection for C51 防止8051瞬間掉電之外部保護應用線路設計 External Brown-out Protection for C51 Microcontrollers with Active High Reset Input 特色(Features): • 低電壓偵測(Low-voltage Detector) • 防止暫存器及EEPROM/FLASH誤動作 (Prevents Register and EEPROM/Flash Corruption) • 獨立的解決方案(One Discrete Solution) •整合 IC的解決方案 (Integrated IC Solution) • 低功耗/低成本的解決方案(Low-power/Low-cost Solution) • 使用一般的元件參數(Formulas for Component Value Calculations) • 完整並簡單的線路設計(Complete with Sample Schematics) 內容介紹 (Introduction): 這份應用文件詳細的說明如何防止系統在電源不穩定時出現當機情形,這種低電壓偵測線路可以防止MCU再運行 程序時不被不穩定的電源供應所影響 .這種瞬間電壓下降到工作電壓以下的現象通常被稱做”Brown-outs”, 而極短暫 的工作電壓完全消失的現象通常被稱作為 ”Black-outs”. 這種低電壓保護應用線路說明的非常詳細,並且可以讓使用者依照系統特性自行調整參數使用這種線路可以預防. 下列幾種現象發生: MCU暫存器錯誤 . I/O暫存器錯誤 . I/O Pin上出現異常訊號. IC內部記憶體錯誤 . IC外部記憶體錯誤. This application note shows in detail how to prevent system malfunction during periods of insufficient power supply voltage. It describes techniques to prevent the MCU from executing code during periods of insufficient voltage by using external low voltage detectors. These events are often referred to as “Brown-outs”, where power supply voltage drops to an insufficient level, or “Black-outs” where power supply voltage totally disappear for a period of time. One discrete solution is discussed in detail, allowing the user to calibrate the system requirements. A complete guide to Integrated Circuit (IC) solutions is also included. By implementing these techniques, the following can be prevented: • MCU Register Corruption • I/O Register Corruption • I/O-pin Random Toggling • On-chip Memory Corruption (SRAM, EEPROM, Flash) • External Memory Corruption 1 SyncMOS FAE 2004/02 新茂國際科技股份有限公司