故障模拟和测试分档.docx

AEC ? Q100-007 Rev-A AEC ? Q100-007 Rev-A Automotive Electronics Council Component Technical Committee AEC-Q100-007 Rev-A FAULT SIMULATION AND TEST GRADING AEC-Q100-007 Rev-A 故障模拟和测试分档 AEC ? Q100-007 Rev-A AEC ? Q100-007 Rev-A Pagel of 12 Pagel of 12 Automotive Electronics Council Component Technical Committee METHOD 一 007 方法一007 FAULT SIMULATION AND TEST GRADING 故障模拟和测试分档 Text enhancements and differences made since the last revision of this document are shown as underlined areas. 卜划线区域友示上一版本后增加的文字和不同之处。 L PURPOSE 目的 This test method defines test grading procedure and specifies a level to which the manufacturing test program for the device under test must detect faults. Parametric failures are not covered. Another term for test grading is fault simulation. Test grading applies to all digital circuits including the digital portion of mixed signal and linear circuits. Test grading does not apply to the linear portion of the circuits.该测试方法决定了测试分档程序并特别说明了到哪个 等级运行中的该测试程序必须能探测到不良。这里不包括参数不良。测试分档的另一种说法是故障模拟?测试分档可 应用于所有数字电路包括多信号和线性电路的数字部分。测试分档不可应用于集成电路的线性部分。 Also, this document covers modeling and logic simulation requirements; the assumed fault model and fault simulation requirements; and the procedure that must be followed to evaluate and report fault coverage. 同样，该文件也包含了建模和逻辑模拟要求：假定的故障模型和故障模拟要求：以及必须用「评价和报告故障栃盖的 程序。 2. PROCEDURE 程序 Simulation 模拟 Simulation is an imitative process used to study relationships between parameters that interact in an Integrated Circuit. The simulator must support at least zero (0), one (1) and unknown (X) logic states. In addition, the simulator must support appropriate “strengths” to enable correct modeling of logic based upon the target technology and design practices. 模拟是一个模仿的过程，用来研究集成电路中相互影响的参数之间的关系。模拟為必须至少支持0, 1和未知X的選 辑说明.同外，在目标技术和设计实.的基確匕 模拟器必须具有适当的能〃来纠正逻辑建模. Simulation employs models that are replica accurate enough to imitate the behavior of the circuit. Integrated circuits can be described at several levels of abstraction: 模拟使用那些有者足够精