AFM-IR纳米红外在高分子聚合物中的应用.pdf

The world leader in nanoscale IR spectroscopy Achieve a deeper understanding of polymeric systems • nanoIR spectroscopy uniquely and unambiguously identifies the chemical composition of polymeric thin films and multilayer structures • Tapping AFM-IR provides 10 nm chemical mapping spatial resolution with simultaneous mechanical property mapping • nanoscale IR spectroscopy directly correlates to bulk FTIR libraries for easy material identification Abstract Image: PS/PMMA blend chemical contrast image This note describes the application of the nanoIR2- FSTM system to the chemical characterization of a range of polymeric materials and structures. The nanoIR2-FS system is based on a scientific breakthrough technique of acquiring IR spectra at spatial resolutions well below the diffraction limit of conventional IR spectroscopy, enabling researchers to obtain nanoscale chemical fingerprints of their material. The spectra generated using Anasys Instruments’ patented AFM-IR™ technique directly correlate with traditional FTIR spectra, and are thus searchable in standard FTIR databases. In addition to chemical analysis, the nanoIR2-FS provides the ability to probe mechanical, thermal, and topographical properties of samples with nanoscale spatial resolution. Key words AFM-IR | Nanoscale IR spectroscopy | Polymers | Multilayer film | Quantification of chemical content | Polymer Introduction Until now, the major drawback of AFM has been its inability to chemically characterize the material Infrared (IR) spectroscopy is one of the most underneath the tip. When combined with an IR source; recognized analytical measurement techniques in the resulting AFM-IR technique breaks the diffra