《Effect of light-beam deviation on the instrument matrix of the four-detector photopolarimeter 》.pdfVIP

Effect of light-beam deviation on the instrument matrix of the four-detector photopolarimeter Jian Liu, MEMBER SPIE Abstract. Analytical geometry, ray tracing, and the Mueller-matrix cal- University of Texas at Austin culus are used to determine the calibration matrix of the four-detector Department of Electrical and Computer photopolarimeter (FDP) when the incident light beam deviates from the Engineering optical axis of the instrument. Detectors of the FDP are represented by Austin, Texas 78758 their surface equations in Cartesian coordinates. The instrument matri- E-mail: jliu3@ ces corresponding to angular deviations of 0.5 and 1.0 deg in refer- ence horizontal and vertical planes, and their differences from the unper- Rasheed M. A. Azzam, FELLOW SPIE turbed matrix are given for two FDP configurations. Output Stokes University of New Orleans parameters that correspond to several typical input states of polarization Department of Electrical Engineering are calculated to demonstrate the effects of light-beam deviation. © 1997 New Orleans, Louisiana 70148 Society of Photo-Optical Instrumentation Engineers. Subject terms: polarization; four-detector photopolarimeter; incident light beam; field of view. Paper 29026 received Feb. 21, 1996; revised manuscript received Oct. 15, 1996;