ASIC测试简介(国外英文资料).doc

ASIC测试简介(国外英文资料) Directory: -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- Measuring repeatability and reproducibility (GRR) ElectricalTestConfidence Electrical test limit space (Guardband) Electrical test parameter CPK 5, electrical test model (testyield) Wafer testing and aging (waferleveltestandbur-in) Boundary Scan (border-scan) test/JTAG standard Self-test circuit (build-inselftest) Automatic test graphical vector generation (ATPG) GRR is a parameter used to evaluate the ability of a test device to repeat the value of the same test object over and over again. This means that GRR is an indicator of the stability and consistency of the test facility. This is especially important for semiconductor testing equipment. From a mathematical point of view, the GRR is the deviation of actual measurements. The test engineer must minimize the GRR value of the device as much as possible, and the excessive GRR value indicates the instability of the test device or method. As the GRR name suggests, this metric contains two aspects: repeatable and reproducible. Repeatability refers to the ability of the same test equipment to be consistently tested by the same operator. Repeatability is the ability of the same test system to have consistent test results over and over by different operators. Of course, in the real world, there is no test device that can be consistently tested in a consistent way, and it is usually affected by five factors: 1, the test standard 2, test methods, 3, test instruments 4, testers, 5, environmental factors All of these factors will affect the each test results, the accuracy of the test results only to ensure that the above five factors affect only under the control to a minimum level of assurance. There are a number of ways to calculate the GRR method, which is recommended by the