accurate permittivity measurements for microwave imaging via ultra-wideband removal of spurious reflectors准确测量介电常数的微波成像通过超宽带伪反射镜.pdfVIP

Sensors 2010, 10, 8491-8503; doi: 10.3390/s100908491 OPEN ACCESS sensors ISSN 1424-8220 /journal/sensors Article Accurate Permittivity Measurements for Microwave Imaging via Ultra-Wideband Removal of Spurious Reflectors Mathew G. Pelletier 1,*, Joseph A. Viera 2, John Wanjura 1 and Greg Holt 1 1 United States Department of Agriculture, Agricultural Research Services, Lubbock TX, 79403 USA; E-Mails: John.Wanjura@ (J.W.); Greg.Holt@ (G.H.) 2 Sensors Group Microsemi Corp. Lowell MA, 01851 USA; E-Mail: jviera@ * Author to whom correspondence should be addressed; E-Mail: Mathew.Pelletier@. Received: 5 August 2010; in revised form: 31 August 2010 / Accepted: 1 September 2010 / Published: 10 September 2010 Abstract: The use of microwave imaging is becoming more prevalent for detection of interior hidden defects in manufactured and packaged materials. In applications for detection of hidden moisture, microwave tomography can be used to image the material and then perform an inverse calculation to derive an estimate of the variability of the hidden material, such internal moisture, thereby alerting personnel to damaging levels of the hidden moisture before material degradation occurs. One impediment to this type of imaging occurs with nearby objects create strong reflections that create destructive and constructive interference, at the receiver, as the material is