EMI电磁探头的设计与校准方法.pdfVIP

证了所提方法的可行性和准确性。该校准方法可以全面衡量探头对待测场的耦合与对非待测

场的抑制程度，弥补了目前IEC61967-6标准中忽略非待测场对探头输出干扰的缺陷。

关键字：电磁干扰电场探头磁场探头多分量探头等效电路校准方法

Abstract

Inacomplexelectromagneticenvironment,electronicproductsmustnotonlyensurestable

operationwithoutinterference,butalsoensurethattheirnear-fieldandfar-fieldradiationdoesnot

causeinterferencetootherdevices.Withthepopularizationof5Gandthedevelopmentof6G

technology,theoperatingfrequencyofelectronicequipmenthasbeengreatlyincreased,makingthe

sizeofcircuitboards,packagesandevenchipscomparabletothewavelengthofthemainfrequency

oritsharmonics,thusbecominganunknownantenna,electromagneticinterferenceproblemsare

gettingworse.Forthisreason,strictelectromagneticcompatibilityaccessstandardsforelectronic

products(IEC61000,FCCpart15,CISPR22,etc.)arestipulatedathomeandabroad.Inorderto

ensurethatelectronicproductspassstandardinspectionsandsavetimeforrectification,inrecent

years,electromagneticinterferencediagnosissystemsbasedonnear-fieldscanninghavebecomean

indispensablemethodintheindustry.Electricandmagneticfieldprobesarekeycomponentsofthe

system,whichdirectlyaffectsitstesting.Precisionandefficiency.Thisarticlefocusesontheactual

needsofnear-fielddiagnosisofwell-knowndomesticcommunicationmanufacturers,anddoesthe

followingworkontheequivalentcircuit,structuraldesignandcalibrationmethodofelectricand

magneticprobes:

First,basedonthemagneticdipoleandparallelplatecapacitancemodels,theworkingprinciples

andequivalentcircuitsofshieldedmagneticfieldprobesandelectricfieldprobesaresystematically

studied.Inparticular,theinfluenceofthemagneticfieldontheelectricfieldprobeandtheinfluence

oftheelectricfieldont