Lecture 19Fault-Model Based Structural Analog Testing.ppt

Copyright 2001, Agrawal Bushnell VLSI Test: Lecture 19 Lecture 19Fault-Model Based Structural Analog Testing Types of Structural Faults Catastrophic (hard): Component is completely open or completely shorted Easy to test for Parametric (soft): Analog R, C, L, Kn, or Kp (a transistor K parameter) is outside of its tolerance box) Very hard to test for Analog Fault Models First stage gain R2 / R1 High-pass filter gain R3 and C1 High-pass filter cutoff f C1 Low-pass AC voltage gain R4, R5, C2 Low-pass DC voltage gain R4 and R5 Low-pass filter cutoff f C2 Levels of Abstraction Structural Level Structural View – Transistor schematic Behavioral View – System of non-linear partial differential equations for netlist Functional Level Structural View – Signal Flow Graph Behavioral View – Analog network transfer function Analog Test Types Specification Tests Design characterization – Does design meet specifications? Diagnostic – Find cause of failures Production tests – Test large numbers of linear/mixed-signal circuits DC Analog Fault Simulation Complementarity Pivoting P. M.Lin and Y. S. Elcherif, Analogue Circuits Fault Dictionary – New Approaches and Implementation, Int’l. J. of Circuit Theory and Applications, 1985 Model all non-linear devices with piecewise-linear I-V characteristics (ideal diodes) Represent open, short, and parametric faults with switches Formulate as n-port network complementarity problem Solve with Lemke’s complementarity pivoting algorithm Use m pairs of complementarity variables (port currents and voltages) One-Step Relaxation W. Tian and C.-J. Shi, Nonlinear DC-Fault Simulation by One-Step Relaxation – Linear Circuit Models are Sufficient for Nonlinear DC–Fault Simulation, VTS-1998 Solve f (x) = 0, x is circuit variable vector (node voltages and branch currents), f is non-linear system function Guess x (0) Solve Jacobian: Jf (xg) (xf(1) – xg)= -ff (xg) Operate New