selected area xps analysis for identification of pigment compounds in microscopic paint flakes选择区域xps分析微观油漆片中色素化合物的识别.pdfVIP

Hindawi Publishing Corporation Research Letters in Materials Science Volume 2008, Article ID 247053, 4 pages doi:10.1155/2008/247053 Research Letter Selected Area XPS Analysis for Identification of Pigment Compounds in Microscopic Paint Flakes Bryony Joanne James,1 Rebecca Cameron,2 and Camilla Baskcomb2 1 Department of Chemical and Materials Engineering, University of Auckland, Private Bag 92019, 1142 Auckland, New Zealand 2 Auckland Art Gallery Toi o Tamaki, P.O. Box 5449, Auckland, New Zealand ¯ Correspondence should be addressed to Bryony Joanne James, b.james@auckland.ac.nz Received 9 March 2008; Accepted 6 May 2008 Recommended by Vladimir Tsukruk The application of X-ray photoelectron spectroscopy to the analysis of paint flakes from a painting by Henry Fuseli (1741–1825) is presented. Historically, the application of XPS to art conservation and restoration studies has been limited by the poor spatial resolution of the technique. Presented here is the successful analysis of paint flakes in the order of 100 μm using “imaging” XPS in conjunction with selected area analysis. Raman microscopy failed to satisfactorily identify the compounds present in this instance, and energy dispersive spectroscopy could not differentiate between lead and sulphur (two of the elements of interest) due to the limited energy resolution inherent in that technique. Using XPS analysis of the lead 4f peak revealed that the pigment was a lead- based pigment, in this case comprising exclusively lead-sulphur compounds. Copyright © 2008 Bryony Joanne James et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly