signal coding and cmos gates for combinational functional blocks of very deep submicron self-checking circuits信号编码和组合功能块的深亚微米cmos盖茨自检电路.pdfVIP

VLSI DESIGN (C) 2000 OPA (Overseas Publishers Association) N.V. 2000, Vol. 11, No. 1, pp. 23-34 Published by license under Reprints available directly from the publisher the Gordon and Breach Science Photocopying permitted by license only Publishers imprint. Printed in Malaysia. Signal Coding and CMOS Gates for Combinational Functional Blocks of Very Deep Submicron Self-checking Circuits CECILIA METRAa’*, MICHELE FAVALLIb’t and BRUNO RICC(a’t aDEIS- University ofBologna, Viale Risorgimento 2, 40136 Bologna, Italy; b University ofFerrara, Via Saragat 1, 44100 Ferrara, Italy (Received I April 1999; In final form 5 October 1999) In this paper we propose signal coding and CMOS gates that are suitable to self- checking circuits with combinational functional blocks implemented also by next gen- eration, very deep submicron technology. In particular, our functional blocks satisfy the Strongly Fault-Secure property with respect to a wide set of possible, internal faults including not only conventional stuck-ats, but also transistor stuck-ons, transis- tor stuck-opens, resistive bridgings, delays, crosstalks and transient faults, that are very likely to affect next generation ICs. Compared to alte