物体表面多反射特性对三维测量结果影响研究及其改进方法-research on the influence of multi-reflection characteristics of object surface on three-dimensional measurement results and its improvement method.docxVIP

华 中 科 技 大 学 硕 士 学 位 论 文 II 万方数据 Abstract With the increasing development of structured light measurement technology, it has been applied in more and more fields, from the original industrial reverse, industrial precision testing, gradually extended to digital heritage, medicine, arts and crafts design, architects design, etc. In these applications, a higher demand is raised for the process of measurements, it should be able to get the real morphology of the measured surface, while should not be affected by the color, texture and material of the object. When using the existing 3D scanning device, the acquired data is affected by the surface texture, scattering and inter-reflection. Detailed analysis about the error caused by light illumination is processed in this paper. Compared with the existing measurement model, we propose a new model concerning the global illumination, and find out the derivation of the error. For further exploration for the solution, we give deep analysis for the methods proposed by others and design experiments to verify these methods, confirm that these solutions cannot achieve the goal and remove the affection completely. Inspired by those methods, this paper presents a new method. We take advantage of the different frequencies of the projected patterns for different kinds of indirect components. On this basis, we use XOR to generate the required patterns, the combined these patterns to remove the error caused by global illumination. Finally, we design experiments to verify the method we presented. And we find out that the method is available for any kinds of object when measured by structured light measurements. . Key word: structured light indirect illumination inter-reflection scattering pattern frequency remove the indirect component  PAGE 4 万方数据 目 录 摘 要 I  HYPERLINK \l _bookmark0 AbstractII  HYPERLINK \l _bookmark1 1 绪论  HYPERLINK \l _bookmark2 1.1 结构光测量概述 (1)  HYPERLINK \l _bookmark3 1.2 研究发展现状 (5)  HYPERLI