课件：I电容隔离技术详解.ppt

IEC 61000-4-8 (1kHz only) and IEC61000-4-9 (1kHz to 100MHz) describe test to quantify the magnetic immunity of parts, i.e. what field-strength can be applied without causing false toggeling. The green line shows the minimum level as required by the standard. Red shows magnetic couplers, yellow indicates the outstanding performance of the new capacitive couplers. Highlighting magnetic immunity of capacitive coupling vs. magnetic schemes naturally triggers the question for e-field-immunity, even though this is not a frequently used test. Nemko had tested our parts with the above setup, where the device under test is exposed to a field applied via an antenna with varying frequency. The relative orientation is varied. The outcome is listed above: Even with 100V/m filed-strength, no errors occurred with the ISO7221C (25Mbps bidirectional dual-coupler) neither within 80MHz to 1GHz per IEC61000-4-3 nor within 30MHz to 1GHz per MIL-STD 461E. For lower frequencies (2MHz to 30MHz), MIL-STD 461E demands even 200V/m, but even this is not an issue with the ISO72xx. For comparison, magnetic couplers showed failures at high frequencies (see next pages for details). Above diagram shows TDDB (Time Dependent Dielectric Breakdown) test results, drawn on a semi-logarithmic scale, time to fail in years over stress-voltage in RMS-volts. A number of devices from different production lots is stressed continuously with voltages exceeding the rated voltage by far. For each test-voltage, the time to fail for the first part failing is noted. The pink dots show ADIs test results taken at 800Vrms through 1200Vrms the non-linear extrapolation results into the 50years lifetime-prediction at 565V peak or ~400Vrms. The green dots show TI’s ISO721 test-points, for quick results taken at much higher voltage. The above shows the same data-points on the same scales, just the extrapolation is linear now. This results into the 28 years lifetime for TI-capacitive couplers, that we specify. With the linear