培训课件射线荧光分析导论.pptVIP

培训课件射线荧光分析导论演示文稿当前第1页\共有65页\编于星期三\22点 （优选）培训课件射线荧光分析导论当前第2页\共有65页\编于星期三\22点 Theory入射X射线轰击原子的内层电子，如果能量大于它的吸收边，该内层电子被驱逐出整个原子（整个原子处于高能态，即激发态）。较高能级的电子跃迁、补充空穴，整个原子处于低能态，即基态。由高能态转化为低能态，释放能量。 ΔE=Eh-El. 能量将以X射线的释放，产生X射线荧光。当前第3页\共有65页\编于星期三\22点 The HardwareSourcesOpticsFilters TargetsDetectors当前第4页\共有65页\编于星期三\22点 SourcesEnd Window X-Ray TubesSide Window X-Ray TubesRadioisotopesOther SourcesScanning Electron MicroscopesSynchrotronsPositron and other particle beams 当前第5页\共有65页\编于星期三\22点 End Window X-Ray TubeX-ray TubesVoltage determines which elements can be excited. More power = lower detection limitsAnode selection determines optimal source excitation (application specific).当前第6页\共有65页\编于星期三\22点 Side Window X-Ray TubeBe WindowSilicone InsulationGlass EnvelopeFilamentElectron beamTarget (Ti, Ag,Rh, etc.)Copper AnodeHV Lead当前第7页\共有65页\编于星期三\22点 RadioisotopesIsotopeFe-55Cm-244Cd-109Am-241Co-57Energy (keV)5.914.3, 18.322, 8859.5122Elements (K-lines)Al – V Ti-BrFe-MoRu-ErBa - UElements (L-lines)Br-II- PbYb-PuNonenoneWhile isotopes have fallen out of favor they are still useful for many gauging applications.当前第8页\共有65页\编于星期三\22点 Other SourcesSeveral other radiation sources are capable of exciting material to produce x-ray fluorescence suitable for material analysis.Scanning Electron Microscopes (SEM) – Electron beams excite the sample and produce x-rays. Many SEM’s are equipped with an EDX detector for performing elemental analysisSynchotrons - These bright light sources are suitable for research and very sophisticated XRF analysis. Positrons and other Particle Beams – All high energy particles beams ionize materials such that they give off x-rays. PIXE is the most common particle beam technique after SEM. 当前第9页\共有65页\编于星期三\22点 Source ModifiersSeveral Devices are used to modify the shape or intensity of the source spectrum or the beam shapeSource FiltersSecondary TargetsPolarizing TargetsCollimatorsFocusing Optics当前第10页\共有65页\编于星期三\22点 Source FiltersFilte