摩擦力显微镜简述（国外英文资料）.doc

摩擦力显微镜简述（国外英文资料） The repulsive model atomic force microscope (AFM) The microcantilever is one of the key components of the atomic force microscope (AFM), which is usually made from a single 100 ~ 500 mu m long and about 500 nm to 5 mu m thick silicon or nitride silicon. There is a sharp tip at the top of the micro-cantilever, which is used to detect the interaction between the sample and the tip. For normal morphology imaging, probe tip continuous (contact mode) or discontinuous (tapping mode) contact with the sample, and makes grating patterns on the sample surface scan. The relative motion of the needle point and sample position is controlled by computer. When the voltage is applied to the piezoelectric scanner electrode, it produces a small amount of movement. According to the precise movement of the piezoelectric scanner, the image and force measurements can be made. The atomic force microscopy (AFM) design can be different, and the scanner can be scanned by a sample under a microcantilever, or a microcantilever scan on the sample. Atomic force microscope (AFM) piezoelectric scanner can usually in three directions (x, y, z), due to the size and scan design chooses different piezoelectric ceramic, scanner scanning scope biggest x, y direction can change between 500 nm ~ 125 microns, vertical z axis is usually a few microns. Can a good scanner be less than 1? The scale creates a steady movement. Through on the sample surface scanning atomic force microscope (AFM) micro cantilever (or making samples under the cantilever) deformation, and the record of the microcantilever can be measured on the surface of the sample height. A three-dimensional image of the surface of the sample can be obtained by drawing the horizontal position of the sample in the horizontal position of the probe tip. Using the tap mode technique, the amplitude or phase change of the oscillatory microcantilever is measured, and the surface of the sample can be imaging. The friction microscope The f