quantitative boundary support characterization for cantilever mems量化边界支持悬臂mems的表征.pdfVIP

Sensors 2007, 7, 2062-2079 sensors ISSN 1424-8220 © 2007 by MDPI /sensors Full Research Paper Quantitative Boundary Support Characterization for Cantilever MEMS Gino Rinaldi, Muthukumaran Packirisamy * and Ion Stiharu Optical Microsystems Laboratory, CONCAVE Research Center Department of Mechanical Industrial Engineering, Concordia University, Montreal H3G 1M8, Canada E-mail: grin@alcor.concordai.ca; pmuthu@alcor.concordia.ca; istih@alcor.concordai.ca * Author to whom correspondence should be addressed. Received: 6 September 2007 / Accepted: 26 September 2007 / Published: 3 October 2007 Abstract: Microfabrication limitations are of concern especially for suspended Micro- Electro-Mechanical-Systems (MEMS) microstructures such as cantilevers. The static and dynamic qualities of such microscale devices are directly related to the invariant and variant properties of the microsystem. Among the invariant properties, microfabrication limitations can be quantified only after the fabrication of the device through testing. However, MEMS are batch fabricated in large numbers where individual testing is neither possible nor cost effective. Hence, a suitable test algorithm needs to be developed where the test results obtained for a few devices can be applied to the whole fabrication batch, and also to the foundry process in general. In this regard, this paper proposes a method to test MEMS cantilevers under var