基于闭环自检和双备份数据存储器设计与实现-design and implementation of data storage base on closed loop self-check and double backup.docxVIP

Design and Implementation of A Self-loop and double backup Data Storage DevicesAbstractThe subsystem of the telemetry system plays an important role in the whole flight experimental. Data memory is used to record the working environment parameters of function of each part for flying body in the telemetry system, the working environment parameters including multi-channel analogue quantity and digital quantity, the system completes data acquisition and decoding through the Purchasing cataloguing and decoding module, and sends the important data of collection and decoding to store records. After the test flight,it is to be searching through the hard recovery of the navigation data memory, and then analysis and process the storage of recovery data.The thesis, according to the task requirements and the technical indexes of data memory of the telemetry system, puts forward a design scheme of the whole system, introduces the design requirements of the data memory, the photoelectric converter and the ground comprehensive test-board. The system uses the design concept of modular, high integration and high reliability, with the FPGA of programmable logic devices as the central control processor, completes the logic and control design for analogue purchasing cataloguing unit, PCM digital quantity unit, double-FLASH memory unit and other function module unit; with the solid-state FLASH for storage medium, completing the double-backup data storage for the three-way vibration signals, three-way noise signals and one high-speed PCM code of the flight test; introduces the design for hardware and software of each functional parts of the data storage in detail, and makes the analysis and research for the key technologies of the mixed woven-frame of analogue-digital, double-backup data storage, the closed-loop self-check mode and data transmission in long distance etc; From the reliability of data storage, systematically describes the design method of reliability of the data memory,