SPM在电子材料与其制备工艺的表征与分析中的应用分析.pdfVIP

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  • 2019-03-28 发布于广东
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SPM在电子材料与其制备工艺的表征与分析中的应用分析.pdf

Abstract Fortheexcellentresolutioninthereal of ability potentialapplications space,the the Probe thecharacterizationand of ScanningMicroscope(SPM)in analysis materialswere illuminated. electronic systematically to scaleof effectsof onthe atomic SPM,the a)Basedhi曲resolution,up trealmentsontheir and differentsilicon-water micro-roughness studied.The with were morphologies cleaningprocesspre-oxidation and concentrationratioofSC一1 solutionscould proper cleaning technique onwafer reducethe effectofSC·1solution roughness.A efficiently negative measure new on to thecontactof method,based angle SPM.Ⅵ∞proposed the treatmentsonthe effectofdifferent surfaces,and roughness hydrophilic and was wettability analyzed. causesno tothe surfaces MSPMis to and easyoperate damagesample during itcallbeusedtomonitorandtestthe or scanningprocess,so physical chemicalonfilmsurfacesinrealtime

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