memory存储芯片nandc3r4n5azcc5eif中文规格书.docxVIP

Asynchronous Data Output Data can be output from a die (LUN) if it is in a READY state. Data output is supported following a READ operation from the NAND Flash array. Data is output from the cache register of the selected die (LUN) to DQ[7:0] on the falling edge of RE# when CE# is LOW, ALE is LOW, CLE is LOW, and WE# is HIGH. If the host controller is using a rRC of 30ns or greater, the host can latch the data on the rising edge of RE# (see Figure 16 for proper timing). If the host controller is using a lRC of less than 30ns, the host can latch the data on the next falling edge of RE# (see Figure 17 (page 27) for extended data output (EDO) timing). Using the READ STATUS ENHANCED (78h) command prevents data contention following an interleaved die (multi-LUN) operation. After issuing the READ STATUS ENHANCED (78h) command, to enable data output, issue the READ MODE (OOh) command. Data output requests are typically ignored by a die (LUN) that is busy (RDY = 0); however, it is possible to output data from the status register even when a die (LUN) is busy by first issuing the READ STATUS (70h) or READ STATUS ENHANCED (78h) command. RDYFigure 16: Asynchronous Data Output CyclesVCE#CHZREAREAtRPtCOH/RE#tRHZDQxtRRtRCDOUTdoutdout RDY Figure 16: Asynchronous Data Output Cycles V CE# CHZ REA REA tRP tCOH / RE# tRHZ DQx tRR tRC DOUT dout dout tRHZ tRHOH \///\ Dont Care Configuration Operations The SET FEATURES (EFh) and GET FEATURES (EEh) commands are used to modify the targets default power-on behavior. These commands use a one-byte feature address to determine which subfeature parameters will be read or modified. Each feature address (in the OOh to FFh range) is defined in Table 9. The SET FEATURES (EFh) command writes subfeature parameters (P1-P4) to the specified feature address. The GET FEATURES command reads the subfeature parameters (P1-P4) at the specified feature address. Unless otherwise specifed, the values of the feature addresses do not change when RESET (FF