Influence of deposition rate on the properties of ZrO2 thin films prepared in electron beam evaporation method.pdfVIP
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Influence of deposition rate on the properties of ZrO2 thin films prepared in electron beam evaporation method.pdf
维普资讯
364 CHINESEOPTICSLETTERS|Vo1.2No.6|June102004
Influenceofdeposition rateon thepropertiesof
ZrO2thin filmsprepared in
electronbeam evaporation m ethod
_
DongpingZhang(张东平),MeiqiongZhan (占美琼),M ingFang(方 明),
HongboHe(贺洪波),JiandaShao (邵建迭),andZhengxiuFan (范正修)
RD CenterforOpticalThinFilm Coatings,ShanghaiInstituteofOpticsandFineMechanics
ChineseScienceAcadem~ Shanghai201800
Received January8,2004
Zr0,thin filmswereprepared in electronbeam thermalevaporationmethod.Andthedeposition rate
changedfrpin1.3to6.3nnl/sinourstudy.X—raydiffractometerandspectrophotometerwereemployedto
characterizethefilms.X.raydiffraction fXRD1spectrapatternshowsthatfilmsstructurechangedfrpin
am orphoustoDolvcrvstallinewith depositionrate increasing.Theresultsindicatethatinternalstresses
ofthefilmsarecompressiveinmostcase.Thin film sdeposited inourstudyraeinhomogeneous,andthe
inhomogeneityisenhancedwith thedeposition rateincreasing.
oCIscodes:310.1860.310.6870.
Due to itsattractive optica1properties.such as low purityO2gas(99,99%)wasusedtobackfil1thechamber
absorption of1ight.high index ofrefraction and trans— to pressureof4x10— Pa duringdeposition to disrupt
parentoverawidespectra1range,Zr0,isathin—fihn thesub—stoichiometryofZrO,films.Beofredeposition,
materialofgreatinterestforoptica1applications[1一 . thecoatingmaterialwasadequatethermallx‘degassed
It isfrequently used asa high refractive—index mate— with ashutterblockingthevaporfrom thesamp
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