高电压技术作者吴广宁第四章4.2课件.pptVIP

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高电压技术作者吴广宁第四章4.2课件.ppt

4.2 介质损耗角正切的测量 4.2 Measurement of dielectric loss tangent tanδ can reflect the overall error of insulation(such as comprehensive aging) and partial serious defect in small capacitance specimen. Though the tanδ-voltage curve, it can be judged that whether the insulation medium is wet, containing bubbles and aging degree. tanδ能反映绝缘的整体性缺陷(例如整体老化)和小电容试品中的严重局部性缺陷。由tanδ随电压而变化的曲线,可判断绝缘介质是否受潮、含有气泡及老化的程度。 但是,测量tanδ不能灵敏地反映大容量发电机、变压器和电力电缆(它们的电容量都很大)绝缘中的局部性缺陷,这时应尽可能将这些设备分解成几个部分,然后分别测量它们的tanδ 。 However, measuring tanδ can’t reflect the partial defect of large-capacity generators, transformers and power cables insulation(their capacity is very large) sensitively, we need divide these facilities into several sections, then measure their tanδ respectively. 4.2.1 西林电桥测量法的基本原理 4.2.1 Basic principle of schering bridge 4.2.2 西林电桥测量法的电磁干扰 4.2.2 Electromagnetic interference of schering bridge 4.2.3 西林电桥测量法的其他影响因素 4.2.3 Other influencing factors of schering bridge 本节内容 Contents in this section 图4-6 西林电桥原理接线图 Figure4-6 Schematic wiring diagram of schering bridge 图中Cx,Rx为被测试样的等效并联电容与电阻,R3、R4表示电阻比例臂,Cn为平衡试样电容Cx的标准电容,C4为平衡损耗角正切的可变电容。 4.2.1 西林电桥测量法的基本原理 4.2.1 Basic principle of schering bridge In the figure, Cx, Rx are equivalent parallel capacitor and resistance of specimen, R3 and R4 represent resistance ratio arm, Cn is standard capacitor of balance sample capacitor Cx, C4 is variant capacitor used to balance loss angle tangent. 根据电容平衡原理,当: According to the principle of capacitor balance, when 式中Zx、Zn、Z3、Z4分别是电桥的试样阻抗,标准电容器阻抗以及桥臂Z3和Z4的阻抗。 In the formula, Zx, Zn, Z3, Z4 represent sample resistance of bridge, standard capacitor impedance and impedance of bridge arm Z3, Z4. (4-6) (4-7) 解方程式得: solving the equation (4-8) (4-9) 当 时,试样电容可近似地按下式计算: When tanδx0.1, sample capacitor can be calculated using following formula approx

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