Reliability of a MEMS Actuator Improved by Spring Corner Designs and Reshaped Driving Waveforms 英文参考文献.docVIP
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Reliability of a MEMS Actuator Improved by Spring Corner Designs and Reshaped Driving Waveforms 英文参考文献
Sensors 2007, 7, 1720-1730
sensors
ISSN 1424-8220
? 2007 by MDPI
/sensors
Full Research Paper
Reliability of a MEMS Actuator Improved by Spring Corner
Designs and Reshaped Driving Waveforms
Hsin-Ta Hsieh and Guo-Dung John Su *
Institute of Photonics and Optoelectronics, National Taiwan University, 1, Roosevelt Road,
Section 4, Taipei, Taiwan; E-mail: .tw.
* Author to whom correspondence should be addressed. E-mail: gdjsu@.tw.
Received: 19 July 2007 / Accepted: 31 August 2007 / Published: 3 September 2007
Abstract: In this paper, we report spring corner designs and driving waveforms to improve
the reliability for a MEMS (Micro-Electro-Mechanical System) actuator. In order to
prevent the stiction problems, no stopper or damping absorber is adopted. Therefore, an
actuator could travel long distance by electromagnetic force without any object in moving
path to absorb excess momentum. Due to long displacement and large mass, springs of
MEMS actuators tend to crack from weak points with high stress concentration and this
situation degrades reliability performance. Stress distribution over different spring designs
were simulated and a serpentine spring with circular and wide corner design was chosen
due to its low stress concentration. This design has smaller stress concentration versus
displacement. Furthermore, the resonant frequencies are removed from the driving
waveform based on the analysis of discrete Fourier transfer function. The reshaped
waveform not only shortens actuator switching time, but also ensures that the spring is in a
small displacement region without overshooting so that the maximum stress is kept below
200 MPa. The experimental results show that the MEMS device designed by theses
principles can survive 500 g (gravity acceleration) shock test and pass 150 million
switching cycles without failure.
Keywords: High reliabili
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