new method of vapour discrimination using the thickness shear mode (tsm) resonator蒸汽歧视使用厚度剪切模式的新方法(tsm)谐振器.pdfVIP

new method of vapour discrimination using the thickness shear mode (tsm) resonator蒸汽歧视使用厚度剪切模式的新方法(tsm)谐振器.pdf

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new method of vapour discrimination using the thickness shear mode (tsm) resonator蒸汽歧视使用厚度剪切模式的新方法(tsm)谐振器

Sensors 2003, 3, 187-191 sensors ISSN 1424-8220 © 2003 by MDPI /sensors New Method of Vapour Discrimination Using the Thickness Shear Mode (TSM) Resonator A.F. Holloway*, A. Nabok, M. Thompson, A.K. Ray, D. Crowther and J. Siddiqi Nanotechnology Research Laboratories, School of Engineering, Sheffield Hallam University, City Campus, Pond Street, Sheffield, S1 1WB, UK, Tel: +44 (0)114 2253254. * Author to whom correspondence should be addressed. E-mail: a.f.holloway@shu.ac.uk Received: 31 March 2003 / Accepted:3 May 2003 / Published: 30 June 2003 Abstract: The Impedance analysis technique complemented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode (TSM) resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption. Keywords: Impedance Analysis, QCM, TSM resonator, BVD model Introduction The TSM resonator is now widely used in many sensing applications. In most instances the TSM resonator is configured as a gravimetric mass sensor often referred to as a Quartz Crystal Microbalance (QCM), where the crystal works as the frequency-determining element in an electrical oscillator circuit. In chemical sensing applications the QCM is coated with a chemically active coating which absorbs the target analyte. The additional absorbed mass is reflected in the resonant frequency of t

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