有效消减测试成本的并行技术分析.pdfVIP

总第 251 期 计算机与数字 t程 Vol. 38 No.9 2010 年第 9 期 Cornputer ?-. Digital Engineering 13 有效消减测试成本的并行技术分析* 王敏 1) 张虹1)闰鹏 2) (中国航夭科工集团第二研究院二0 一所 1) 北京 100854)( 北京大学微电子学研究院 soc 测试中心 υ 北京 100084) 摘要 文章通过定量分析指出，并行测试不仅降低了 ATE 系统的设备投资，而且能够消减测试环节中各项成本因 素，因而比之低成本 ATE ，是更为显著、有效的测试成本消减方法。文章还指出，并行测试最佳站点数相对独立于 ATE 设 备成本、运行成本、产品的合格率以及其它多种限制因素，若设备中可用的独立资源、有限，就会降低测试的并行度，从而导致 部分测试顺序执行，并行测试的成本优势将迅速消失。 关键词 测试成本:低成本 ATE; 并行测试 中图分类号 TM93 Parallel Technique Analysis for Effective Reducing Test Cost Wa昭 Min 1l Zhang Hongll Yan Peng2) (The Second Academy of China Aerospace Science and Industry Corporation 201 Institutell , Beijing 100854) Onstitute of Microelectronics of Peking University soc Testing Center刀，Be ijing 100084) Abstract Through a quantitive analysis, this paper points out that parallel test not only reduces the system investment for ATE, but also costs down those crucial factors in the every test procedure. Compared with Low-cost ATE, parallel test provides more significant and more effective way to reduce test cost. In addition, ATE cost 、 operation cost 、 yield and other relative factors have no influence on the best number of sites in parallel test. While , with the limit of independent resources, the multi-site efficiency will decline, leading to apply sequential test in certain parts, which means to advantage of parallel test in cost s∞n disappeared. Key Words test cost, low-cost ATE, parallel test Class Nunber TM93