effect of annealing on structural, morphological, electrical and optical studies of nickel oxide thin films退火的影响在结构、形态、电气和光学氧化镍薄膜的研究.pdfVIP

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effect of annealing on structural, morphological, electrical and optical studies of nickel oxide thin films退火的影响在结构、形态、电气和光学氧化镍薄膜的研究.pdf

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effect of annealing on structural, morphological, electrical and optical studies of nickel oxide thin films退火的影响在结构、形态、电气和光学氧化镍薄膜的研究

Journal of Surface Engineered Materials and Advanced Technology, 2011, 1, 35-41 35 doi:10.4236/jsemat .2011.12006 Published Online July 20 11 (http://www.SciRP.org/journal/jsemat ) Effect of Annealing on Structural, Morphological, Electrical and Optical Studies of Nickel Oxide Thin Films 1* 1 1 1 1 2 Vikas Patil , Shailesh Pawar , Manik Chougule , Prasad Godse , Ratnakar Sakhare , Shashwati Sen , Pradeep Joshi1 1Materials Research Laboratory, School of Physical Sciences, Solapur University, Solapur, India; 2Crystal Technology Section, Bhabha atomic Research Centre, Mumbai, India. Email: drvbpatil@ th rd th Received March 28 , 2011; revised May 3 , 2011; accepted May 13 , 20 11. ABSTRACT Sol gel spin coating method has been successfully employed for the deposition of nanocrystalline nickel oxide (NiO) thin films. The films were annealed at 400 ˚C- 700 ˚Cfor 1 h in an air and changes in the structural, morphological, electrical and optical properties were studied. The structural properties of nickel oxide films were studied by means of X -ray diffraction (XRD ) and scanning electron microscopy (SEM). XRD analysis shows that all the films are crystal- lized in the cubic phase and present a random orientation. Surface morphology of the nickel oxide film consists of na- nocrystalline grains with uniform coverage of the substrate surface with randomly oriented morphology. The electrical -4 conductivity showed the semiconducting nature with room temperature electrical conductivity increased from 10