基于游程编码的测试数据压缩方法分析-仪器科学与技术专业论文.docxVIP

II II The Research of Test Data Compression Based on Run-length Encoding Abstract Integrated Circuits (IC) followed Moores Law, its integration is higher and higher. In recent years, the VLSI developed from SoC (System on a Chip) to NoC (Network on a Chip). The VLSI CMOS technology feature size has also decreased to the nanometer level, under the feature size of this magnitude, the defect density becomes higher and the process instability is also more prominent. While the circuit design becomes complicated, the test of chips becomes more and more difficult, and the testing costs increasing every year. Therefore, exploring rational methods to reduce testing costs become an important research direction. Test data compression techniques can effectively reduce test time and testing cost. This thesis has studied run-length encoding in integrated chip test data compression. This paper proposed a compression scheme based on run-length encoding. The encoding scheme is similar to EFDR code, but the difference is that the run-length indicated by this encoding scheme is 2 bits shorter than EFDR with the same suffix, so the compression rate is slightly lower than EFDR code. After further consideration of the relationship of the run-length, if 0-run-length and 1-run-length with the same length consecutively occurred, we can use different flags to indicate them, thus the compression ratio is increasing more. Keywords: SoC; NoC; Relationship of run-length; Encoding; Date compression III III 致 谢 首先感 谢我的 导师 梁 华国教 授，感 谢梁 老 师的细 心指导 ，使 我 步入测 试数 据压缩 领域， 也感 谢 他给我 提供了 很多 资 料和信 息，梁 老师 严 谨的治 学态度给 了我很大 的鼓舞 。在 此向梁老 师表达 由衷 的敬意！ 感谢安 庆师范 学院 的 詹文法 老师， 感谢 李 光宇、 邹毅文 、杨叔寅、吴 义成 等同学， 他们都 为本 论文的撰 写提供 了很 多帮助。 感谢我的 家人对 我的 支持，使 我能有 足够 的时间安 心做论 文。 最后由衷 感谢参 加论 文评阅的 各位专 家！ 作者： 虎 号 2011 年 11 月 PAGE PAGE VI 目 录 HYPERLINK \l _bookmark0 第一章 绪 论 1 HYPERLINK \l _bookmark1 1.1 片 上系统 测试概 述 1 HYPERLINK \l _bookmark2 1.1.1 研究背 景 1 HYPERLINK \l _bookmark3 1.1.2 研究意 义 1 HYPERLINK \l _bookmark4 1.1.3 研究进