电子显微分析（章晓中）教学课件chapter11.pdfVIP

Chapter 5 TEM imaging • Before 1960s, specimen can not be made thin enough to be electron transparent. The only type of specimen used for TEM observation is replica specimen. Replica specimen can only be used for observation of surface morphology, but not be used for observation of interior of materials. • In 1960s, Hirsch et al did TEM observation directly on the thin foil specimen. They developed diffraction contrast technique and theory which is based on the Bragg diffraction effect. • Using diffraction contrast technique you can not only observe the diffraction contrast image of material, but also obtain many other material information (e.g. crystal structure, phase relationship, defect status etc.). Contrast (衬度） • Contrast (C) is defined in terms of the difference in intensity between two adjacent areas I 1 I 2 I C I 1 I 1 • In practice, your eyes can’t detect intensity changes of 5%, and even 10% is difficult. So unless the contrast from your specimen exceeds 5-10% you won’t see anything on the screen or on the photograph. • If your image is digitally recorded, you can enhance low contrast electronically to levels at which your eyes can perceive (感觉) it. TEM image • TEM image is the result of interaction of incident electron beam with specimen. • When the electron beam go out from the low surface of the specimen, intensity of the transmitted electron beam changes due to the interaction of electron beam with the specimen. So the intensity of electron beam hit the screen is different. This electron image with non-uniform intensity is called contrast image (衬度像）. Kind of TEM contrast • Amplitude contrast （振幅衬度） – mass-thickness contra