用BIXS方法分析氚含量与深度分布中的反演方法研究.pdfVIP

用BIXS 方法分析氚含量及深度分布中的反演方法研究 龙京晶，安竹 四川大学原子核科学技术研究所，辐射物理及技术教育部重点实验室 四川成都，610064 Email: anzhu@scu.edu.cn 摘 要 了解材料中氚的含量及深度分布对于能源研究和国防建设都具有重要意义。近年来提 出的BIXS 方法，其分析深度对于金属材料可达到 100m ，对于非金属材料可达 1mm，并 且可用于现场测量。该方法的难点在于测量数据的反演计算。代替以前用的解析方法，我 们采用了Monte Carlo 方法来模拟氚衰变产生的韧致辐射及特征X 射线及其在材料中的衰 减，并比较分析了采用Tikhonov 正则化处理病态逆问题的三种算法，以及分子动力学方法。 对于所研究的两种体系，即：氩气与含氚钛样品和氩气与含氚钼样品，我们认为，采用Monte Carlo 方法以及合适的处理病态逆问题的反演算法，BIXS 方法能够作为一种分析氚含量及 深度分布的可靠方法。 ABSTRACT It is very important to know the tritium content and depth distribution in materials in many applications. A so-called -ray induced X-ray spectrometry (BIXS) technique has been developed for tritium analysis. The detectable depth by the BIXS technique can reach to ~ 100m for metallic and ~ 1mm for organic materials, and it is available for in situ measurement. This technique ’s difficulty is reconstruction calculation of the measured data. Instead of the analytical method used before, we take Monte Carlo calculations to simulate the tritium’s -decay bremsstrahlung and characteristic X-rays and the attenuation of them in materials. Two systems are studied, i.e. argon with tritium-contained titanium sample and argon with tritium- contained molybdenum sample. The reconstruction results of three codes based on Tikhonov regularization and the classical molecular dynamics (CMD) dealing with the ill-posed problem are compared. It can be concluded that with Monte Carlo calculations and appropriate regularization methods dealing with the ill-posed problem, the BIXS technique can provide a reliable method for tritium content and depth distribution analysis. 关键字：氚分析；Monte Carlo